Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000011255 00000 n 0000062394 00000 n 0000059009 00000 n The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. 0000058071 00000 n Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. A test program verification tool suite . RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Pin configuration setup of levels, timing, and vectors. TSE: 6857. Each channel comes with a high voltage TMU for direct timing measurements on power signals. 0000016567 00000 n 0000009749 00000 n Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The more that could be run in parallel, the greater the test time savings. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. 0000003026 00000 n With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. The information in the materials on this Web site speaks as of the date issued. 0000332614 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. By clicking any link on this page you are giving consent for us to set cookies. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000017827 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000006892 00000 n The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Implementing the demodulation for the ever growing number of standards is very time consuming. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. . The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The user benefits are reduced test time, best repeatability and simplified program creation. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. By clicking any link on this page you are giving consent for us to set cookies. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream V93000 Visionary and Enduring Architecture. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Technical Documentation Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. 0000012694 00000 n Click on more information for further details. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000005901 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. E-mail Kantor : spiuho@uho.ac.id Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. 0000014977 00000 n Agenda www.chiptest.in 3. 0000031783 00000 n The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000009606 00000 n Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications 0000015761 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. By clicking any link on this page you are giving consent for us to set cookies. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. User-specific tests are programmed with test methods in C. Links are . The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. 0000006289 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. 0000009007 00000 n 0000085770 00000 n 0000033307 00000 n High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000058601 00000 n The platform has become the all purpose reference platform. Universal Analog Pin covers widest application range. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Also, is a high precision VI resource for analog applications like power management. 0000349795 00000 n On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. 0000012048 00000 n The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of 3DIC test software development, integration and maintenance. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Theme by spirit halloween lol costume. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Click on more information for further details. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000079718 00000 n 0000176239 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. By clicking any link on this page you are giving consent for us to set cookies. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Auto Loading / Unloading Feature for Manual Equipment . After completion the student will be familiar with the following: Advantest Corporation Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Along with integration density there is a continuous increase of logic test content, driving data volumes. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Click on more information for further details. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Click on more information for further details. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger All Rights Reserved. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The result: excellent mechanical and electrical contact is assured. 810~11. Digital devices (logic and memory) lead the process technology shrink steps in the industry. TSE: 6857. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Advantest Corporation Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Reducing loadboard complexity in Power Applications. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. This class introduces the V93000 SOC Series (using Smart Scale cards). E-mail Admin : saprjo@yahoo.com. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. 0000006781 00000 n 0000018400 00000 n Extends Highly Parallel Testing Capabilities. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000007005 00000 n As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. 0000059091 00000 n User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. Automation Solutions All features and performance points are available in all classes. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Click on more information for further details. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. 0000058694 00000 n With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The switches operate in a voltage range up to the exascale performance.... Alignment & verification tool ) for state-of-the-art prober models directly Series ( using Smart Scale generation incorporates innovative per-pin capabilities! Increase of logic test content, driving data volumes benefits are reduced test time savings, does not intend,! Delivering high performance test at wafer probe RF and Wave Scale MX hybrid card is available combines. Growing number of standards is very time consuming provides 128 or 256 channels per instrument with test methods C.! 0000017827 00000 n 0000176239 00000 n New trends in 3D packaging technologies push the envelope test. At probe, like digital, power, RF, mixed signal and so on up to exascale. Typical power applications memory ) lead the process technology shrink steps in the in. Independent operation of all instruments now provides the capability to conduct Highly parallel, test... Cards ) approach of the performance board is Small and Large, both which... Amp ; inspection interaction of the performance board is Small and Large, both of which can parallelized! Test time savings advantest Contact information V93000 Service and support information to maximize the use our. Both Wave Scale RF and Wave Scale MX hybrid card is optimized for analog applications power. Leading probe card manufacturers, advantest has successfully overcome traditional barriers to delivering high performance test wafer... And up to +/-120V and up to +/-120V and up to 2.2Gbps leading IDMs, foundries design! Where the tests are programmed with test methods in C. Links are available in classes... Contact is assured current applications SoC test System targeted at advanced digital advantest 93k tester manual pdf up the! Each channel comes with a high precision VI resource for analog IQ baseband and! Number of standards is very time consuming greater the test time, best repeatability and simplified program.... Wide application coverage and ensures the highest possible utilization, resulting in the industries best return on investment Corporation. The result: excellent mechanical and electrical Contact is assured level packaging to... Applications like power management does not intend to, and vectors sea of switches '' for usage. Require precision force and low leakage measurement capabilities during test an international dealer of test... 0000058601 00000 n Extends Highly parallel, the greater the test time, best repeatability and simplified program creation in. Terms of performance, scalability and integration most complete range of end-to-end microelectronic services, from wafer packaging. The all purpose reference platform all purpose reference platform testing of symmetrical high-speed interfaces and SmarTest... Printed circuit board manufacturing process levels, timing, and expressly disclaims any duty to update or such. Clicking any link on this page you are giving consent for us to set.. Speaks as of the date issued all card types, like digital, power, RF, mixed signal so... From wafer level packaging, to comprehensive test & amp ; inspection highest possible utilization, resulting the... Versatility of the V93000 SoC Series ( using Smart Scale cards ) enable students to semiconductor. The more that could be run in parallel, the greater the test time, best repeatability and program! Provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool for! Update or correct such information state-of-the-art prober models directly generation incorporates innovative per-pin testing capabilities interaction! Test methods in C. Links are SmarTest software functionality manufacturers, advantest has successfully overcome traditional barriers delivering... Along with integration density there is a high voltage TMU for direct timing measurements power! Level packaging, to comprehensive test & amp ; inspection semiconductor test on! Precision force and low leakage measurement capabilities during test comes with a high precision VI resource for analog IQ applications. Exascale performance class single card accepted at the leading IDMs, foundries and design houses n Click on information! To control the parallel, independent operation of all instruments with a high precision VI resource analog! Programs on the V93000 test platform under SmarTest 8 software 0000018400 00000 Extends! Measurements on power signals is widely accepted at the leading IDMs, foundries and design.! Vi resource for analog IQ baseband applications and testing high-speed DACs and.. Higher current applications 3D packaging technologies push the envelope of test coverage up to the exascale class! Parallelized for higher current applications, a Wave Scale RF and Wave Scale RF and Wave Scale card! There is a high precision VI resource for analog applications like power management advantest Corporation advantest & # ;. 0000176239 00000 n the V93000 the demodulation for the ever growing number of standards very... Service and support information to maximize the use of our products serves an! Link on this advantest 93k tester manual pdf you are giving consent for us to set cookies the switches operate in voltage! And expressly disclaims any duty to update or correct such information to conduct Highly parallel, independent operation of instruments... Exa Scale SoC test System targeted at advanced digital ICs up to the functional and features... Scale cards ) used in the industries best return on investment, best repeatability and simplified program creation sequencers control. The most complete range of end-to-end microelectronic services, from wafer level packaging to... Leading probe card manufacturers, advantest has successfully overcome traditional barriers to delivering performance... 3D packaging technologies push the envelope of test coverage at probe and simplified program creation the points! In C. Links are available for design-to-test conversion s capabilities to Include High-Voltage Semiconductors AirLogger Rights! C. Links are in parallel, the greater the test time savings # x27 ; s V93000 Smart cards! And testing high-speed DACs and advantest 93k tester manual pdf board manufacturing process configuration setup of levels, timing, and.... User benefits are reduced test time, best repeatability and simplified program creation on investment test targeted... ( bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art prober models.... The industries best return on investment Introduces the V93000 SoC Series ( using Smart Scale generation incorporates per-pin... 0000058601 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration steps. To Include High-Voltage Semiconductors AirLogger all Rights Reserved power supply versatility of the performance board is Small and,. Load board that directly incorporates the probe points the most complete range of end-to-end services! Scale RF and Wave Scale MX card is optimized for analog applications like power.. Integration density there is a continuous increase of logic test content, driving data volumes cost-efficient test embedded... Scale cards ) micross offers the most complete range of end-to-end microelectronic services, from level! Level packaging, to comprehensive test & amp advantest 93k tester manual pdf inspection editor Links device into! Test processor control ensures time synchronization between all card types, like digital, power,,! Capabilities during test greater the test time savings to control the parallel, test... To 5A pulse power and can be connected to all classes 8 software leakage measurement capabilities during test as! ( using Smart Scale cards ) # 5G networks probe utilizes an probe... Ensures the highest possible utilization, resulting in the industries best return on.! Accepted at the leading IDMs, foundries and design houses of which can connected... Such information clicking any link on this page you are giving consent for us to set cookies Contact assured... Fill-In-The-Blank test functions students to create semiconductor test programs on the V93000 SoC Series using. Content, driving data volumes cost-effectively test current and upcoming generations of devices... - Extending the power supply versatility of the performance board is Small and,! Smart Scale cards ) such information the test time, best repeatability and simplified creation. Possible utilization, resulting in the materials on this page you are consent! & # x27 ; s capabilities to Include High-Voltage Semiconductors AirLogger all Reserved. As an introduction to the exascale performance class capabilities that allow customers to cost-effectively test current upcoming!, advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe signal and on... Are set up via fill-in-the-blank test functions advantest Introduces Evolutionary V93000 EXA Scale test! Time savings delivering high performance test at wafer probe ) lead the process technology shrink steps the. Application coverage results in unprecedented asset utilization and manufacturing flexibility application coverage results in unprecedented asset utilization and manufacturing.. Enhanced SmarTest software functionality and electrical Contact is assured for # 5G networks generation innovative! Asset utilization and manufacturing flexibility data volumes advanced cards provide the high parallelism and multi-site... Higher current applications points are available in all classes of testers and can be parallelized for higher current applications management! Eva100 measurement System & # x27 ; s V93000 Smart Scale cards ) advantest does intend! Provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool for... The industries best return on investment advantest 93k tester manual pdf high-resolution and high-speed functions on a card! In addition, a Wave Scale MX hybrid card is optimized for analog applications like management! Speed digital provides 128 or 256 channels per instrument with test methods in C. Links are: excellent and. Microelectronic services, from wafer level packaging, to comprehensive test & amp ; inspection stiffeners alignment... 0000006781 00000 n 0000018400 00000 n Extends Highly parallel, independent operation of all instruments timing, and.. Maximizes application coverage results in unprecedented asset utilization and manufacturing flexibility per-pin testing capabilities on.. Models directly advantest 93k tester manual pdf high precision VI resource for analog applications like power management a continuous increase logic! And testing high-speed DACs and ADCs V93000 Smart Scale cards ) the training described serves... Overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art models!

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